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Emerging microstructural characterization methods have received increased attention owing to their promise of relatively inexpensive and rapid measurement of polycrystalline surface morphology and crystallographic orientations. Among these nascent methods, polarized light microscopy (PLM) is attractive for characterizing alloys comprised of hexagonal crystals, but is hindered by its inability to measure complete crystal orientations. In this study, we explore the potential to reconstruct quasi-deterministic orientations for titanium microstructures characterized via PLM by considering the Burgers orientation relationship between the room temperature α (HCP) phase fibers measured via PLM, and the β (BCC) phase orientations of the parent grains present above the transus temperature. We describe this method—which is capable of narrowing down the orientations to one of four possibilities—and demonstrate its abilities on idealized computational samples in which the parent β microstructure is fully, unambiguously known. We further utilize this method to inform the instantiation of samples for crystal plasticity simulations, and demonstrate the significant improvement in deformation field predictions when utilizing this reconstruction method compared to using results from traditional PLM. 

The design of structural and functional materials for specialized applications is experiencing significant growth fueled by rapid advancements in materials synthesis, characterization, and manufacturing, as well as by sophisticated computational materials modeling frameworks that span a wide spectrum of length and time scales in the mesoscale between atomistic and homogenized continuum approaches. This is leading towards a systems-based design methodology that will replace traditional empirical approaches, embracing the principles of the Materials Genome Initiative. However, there are several gaps in this framework as it relates to advanced structural materials development: (1) limited availability and access to high-fidelity experimental and computational datasets, (2) lack of co-design of experiments and simulation aimed at computational model validation, (3) lack of on-demand access to verified and validated codes for simulation and for experimental analyses, and (4) limited opportunities for workforce training and educational outreach. These shortcomings stifle major innovations in structural materials design. This paper describes plans for a community-driven research initiative that addresses current gaps based on best-practice recommendations of leaders in mesoscale modeling, experimentation, and cyberinfrastructure obtained at an NSF-sponsored workshop dedicated to this topic and subsequent discussions. The proposal is to create a hub for "Mesoscale Experimentation and Simulation co-Operation (h-MESO)---that will (I) provide curation and sharing of models, data, and codes, (II) foster co-design of experiments for model validation with systematic uncertainty quantification, and (III) provide a platform for education and workforce development. h-MESO will engage experimental and computational experts in mesoscale mechanics and plasticity, along with mathematicians and computer scientists with expertise in algorithms, data science, machine learning, and large-scale cyberinfrastructure initiatives. 

The effect of an electric field on local domain structure near a 24° tilt grain boundary in a 200 nm-thick Pb(Zr_0.2Ti_0.8)O₃bi-crystal ferroelectric film was probed using synchrotron nanodiffraction. The bi-crystal film was grown epitaxially on SrRuO₃-coated (001) SrTiO₃24° tilt bi-crystal substrates. From the nanodiffraction data, real-space maps of the ferroelectric domain structure around the grain boundary prior to and during application of a 200 kV cm⁻¹electric field were reconstructed. In the vicinity of the tilt grain boundary, the distributions of densities ofc-type tetragonal domains with thecaxis aligned with the film normal were calculated on the basis of diffracted intensity ratios ofc- anda-type domains and reference powder diffraction data. Diffracted intensity was averaged along the grain boundary, and it was shown that the density ofc-type tetragonal domains dropped to ∼50% of that of the bulk of the film over a range ±150 nm from the grain boundary. This work complements previous results acquired by band excitation piezoresponse force microscopy, suggesting that reduced nonlinear piezoelectric response around grain boundaries may be related to the change in domain structure, as well as to the possibility of increased pinning of domain wall motion. The implications of the results and analysis in terms of understanding the role of grain boundaries in affecting the nonlinear piezoelectric and dielectric responses of ferroelectric materials are discussed. 

Thermal annealing is a widely used strategy to enhance semiconductor device performance. However, the process is complex for multi-material multi-layered semiconductor devices, where thermoelastic stresses from lattice constant and thermal expansion coefficient mismatch may create more defects than those annealed. We propose an alternate low temperature annealing technique, which utilizes the electron wind force (EWF) induced by small duty cycle high density pulsed current. To demonstrate its effectiveness, we intentionally degrade AlGaN/GaN high electron mobility transistors (HEMTs) with accelerated OFF-state stressing to increase ON-resistance ∼182.08% and reduce drain saturation current ∼85.82% of pristine condition at a gate voltage of 0 V. We then performed the EWF annealing to recover the corresponding values back to ∼122.21% and ∼93.10%, respectively. The peak transconductance, degraded to ∼76.58% of pristine at the drain voltage of 3 V, was also recovered back to ∼92.38%. This recovery of previously degraded transport properties is attributed to approximately 80% recovery of carrier mobility, which occurs during EWF annealing. We performed synchrotron differential aperture x-ray microscopy measurements to correlate these annealing effects with the lattice structural changes. We found a reduction of lattice plane spacing of (001) planes and stress within the GaN layer under the gate region after EWF annealing, suggesting a corresponding decrease in defect density. Application of this low-temperature annealing technique for in-operando recovery of degraded electronic devices is discussed. 

Abstract Dynamic solidification behavior during metal additive manufacturing directly influences the as-built microstructure, defects, and mechanical properties of printed parts. How the formation of these features is driven by temperature variation (e.g., thermal gradient magnitude and solidification front velocity) has been studied extensively in metal additive manufacturing, with synchrotron x-ray imaging becoming a critical tool to monitor these processes. Here, we extend these efforts to monitoring full thermomechanical deformation during solidification through the use of operando x-ray diffraction during laser melting. With operando diffraction, we analyze thermomechanical deformation modes such as torsion, bending, fragmentation, assimilation, oscillation, and interdendritic growth. Understanding such phenomena can aid the optimization of printing strategies to obtain specific microstructural features, including localized misorientations, dislocation substructure, and grain boundary character. The interpretation of operando diffraction results is supported by post-mortem electron backscatter diffraction analyses. 

The tunable properties of thermoplastic elastomers (TPEs), through polymer chemistry manipulations, enable these technologically critical materials to be employed in a broad range of applications. The need to “dial-in” the mechanical properties and responses of TPEs generally requires the design and synthesis of new macromolecules. In these designs, TPEs with nonlinear macromolecular architectures outperform the mechanical properties of their linear copolymer counterparts, but the differences in deformation mechanism providing enhanced performance are unknown. Here, in situ small-angle X-ray scattering (SAXS) measurements during uniaxial extension reveal distinct deformation mechanisms between a commercially available linear poly(styrene)-poly(butadiene)-poly(styrene) (SBS) triblock copolymer and the grafted SBS version containing grafted poly(styrene) (PS) chains from the poly(butadiene) (PBD) mid-block. The neat SBS (φSBS = 100%) sample deforms congruently with the macroscopic dimensions with the domain spacing between spheres increasing and decreasing along and traverse to the stretch direction, respectively. At high extensions, end segment pullout from the PS-rich domains is detected, which is indicated by a disordering of SBS. Conversely, the PS-grafted SBS that is 30 vol% SBS and 70% styrene (φSBS = 30%) exhibits a lamellar morphology and in situ SAXS measurements reveal an unexpected deformation mechanism. During deformation there are two simultaneous processes: significant lamellar domain rearrangement to preferentially orient the lamellae planes parallel to the stretch direction and crazing. The samples whiten at high strains as expected for crazing, which corresponds with the emergence of features in the two-dimensional SAXS pattern during stretching consistent with fibril-like structures that bridge the voids in crazes. The significant domain rearrangement in the grafted copolymers is attributed to the new junctions formed across multiple PS domains by the grafts of a single chain. The in situ SAXS measurements provide insights into the enhanced mechanical properties of grafted copolymers that arise through improved physical crosslinking that leads to nanostructured domain reorientation for self-reinforcement and craze formation where fibrils help to strengthen the polymer.